�ｿｽd�ｿｽq�ｿｽ�ｿｽ�ｿｽﾆ射にゑｿｽ�ｿｽ�晶趣ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽﾄゑｿｽ�ｿｽ�ｿｽ�ｿｽf�ｿｽB�ｿｽb�ｿｽJ�ｿｽC�ｿｽg

�ｿｽ�ｿｽ�ｿｽ[�ｿｽr�ｿｽ[�ｿｽﾌ再撰ｿｽ�ｿｽ�ｿｽInternet Explorer�ｿｽﾅのみ可能�ｿｽﾆなゑｿｽ�ｿｽﾄゑｿｽ�ｿｽﾜゑｿｽ�ｿｽi2019/5/9 �ｿｽ�ｿｽ�ｿｽﾝ）

�ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽﾌ珪�ｿｽ_�ｿｽ�ｿｽ�ｿｽz�ｿｽ�ｿｽ�ｿｽﾍ電�ｿｽq�ｿｽ�ｿｽ�ｿｽﾆ射に弱く�ｿｽA�ｿｽ�ｿｽ�ｿｽﾌゑｿｽ�ｿｽﾟゑｿｽ�ｿｽﾌ鯉ｿｽ�ｿｽq�ｿｽz�ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽﾅゑｿｽ�ｿｽ�ｿｽﾙどの搾ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽ\�ｿｽ�ｿｽTEM�ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽL�ｿｽ^�ｿｽ�ｿｽ�ｿｽ驍ｱ�ｿｽﾆゑｿｽ�ｿｽ�し�ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽﾌゑｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽD�ｿｽJ�ｿｽI�ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽz�ｿｽ�ｿｽ�ｿｽikaolin group minerals, Al₂Si₂O₅(OH)₄�ｿｽj�ｿｽﾍゑｿｽ�ｿｽﾌよう�ｿｽﾈ珪�ｿｽ_�ｿｽ�ｿｽ�ｿｽz�ｿｽ�ｿｽ�ｿｽﾌひとつで、�ｿｽ�ｿｽ�ｿｽﾌ映�ｿｽ�ｿｽ�ｿｽﾍカ�ｿｽI�ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽz�ｿｽ�ｿｽ�ｿｽﾌ茨ｿｽ�ｿｽﾌデ�ｿｽB�ｿｽb�ｿｽJ�ｿｽC�ｿｽg�ｿｽidickite�ｿｽj�ｿｽ�ｿｽ�ｿｽd�ｿｽq�ｿｽ�ｿｽ�ｿｽﾉゑｿｽ�ｿｽ�晶趣ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽﾄゑｿｽ�ｿｽ�ｿｽ�ｿｽl�ｿｽq�ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽﾔで記�ｿｽ^�ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽﾌでゑｿｽ�ｿｽ�ｿｽD�ｿｽd�ｿｽq�ｿｽ�ｿｽ�ｿｽﾌ具ｿｽ�ｿｽx�ｿｽ�ｿｽ1×10^-16A/Ų (600 electrons/sec/Ų) �ｿｽ�ｿｽ�ｿｽx�ｿｽﾅ、�ｿｽ�ｿｽ�ｿｽ�ｿｽﾍ通擾ｿｽ�ｿｽHRTEM�ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽt�ｿｽB�ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽﾉ記�ｿｽ^(�ｿｽL�ｿｽ^�ｿｽ{�ｿｽ�ｿｽ400,000�ｿｽ{�ｿｽA�ｿｽI�ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽﾔ〜1�ｿｽb�ｿｽ�ｿｽ�ｿｽx)�ｿｽ�ｿｽ�ｿｽ�ｿｽ謔､�ｿｽﾈ具ｿｽ�ｿｽx�ｿｽﾉ対会ｿｽ�ｿｽ�ｿｽ�ｿｽ�ｿｽD
�ｿｽiTEM: JEOL JEM-2010 UHR at 200 kV. Camera: LHESA LH72LL. Sample preparation: ion-milling. �ｿｽj

Kogure, T. and A. Inoue: "Determination of defect structures in kaolin minerals by High-Resolution Transmission Electron Microscopy (HRTEM) ", Am. Mineral., 90 (2005) 85-89. DOI: 10.2138/am.2005.1603